Dual type film thickness meter SWT-NEO series for both ferrous and non-ferrous metals. Connection probes can be selected according to the measurement purpose and object. Easy measurement with easy-to-understand guide display. Data can be transferred to a computer via USB connection. Conforms to various standards such as JIS K 5600 and ISO2808.*Successor model of SWT-9000/9200 series.*As our company is a regular route, after-sales service is also possible.

- Connection probes can be selected according to the measurement purpose.
- By making the probes compatible, you can freely select the connection probe that suits your application and object to be measured. It is now possible to have spare probes and various probes that match the shape of the substrate, greatly increasing work efficiency.
- Easy-to-understand guide display screen
- Easy-to-understand guide display of operating procedures on the LCD screen.
- Data can be transferred to a computer via USB connection
- Measurement data can be transferred by connecting to a computer using a USB cable.
- Transfer in real time each time a measurement is taken.
- It is also possible to send stored data in bulk (excluding NEO).
- key notation
- Key notation has been changed to Japanese to make it easier to understand.
- Unit settings
- Officially equipped with a function to switch the unit setting to "mil".
- slim body design
- The body is cleaner and slimmer than conventional film thickness gauges.
- Excellent grip for women and people with small hands.
- Reduces fatigue during handheld work.
- tilt stand
- Equipped with a new tilt stand that can be used while standing up.
- Built-in statistics function (NEO-II / NEO-III)
- Statistics on all memory data and data in groups, blocks, and sections can be viewed on the LCD screen.
- Calibration curve registration function (NEO-II / NEO-III)
- The number of registered calibration curves is 10 (NEO-II) and 100 (NEO-III).
- You can start measurement work immediately by registering and selecting a calibration curve that matches the characteristics.
- Upper limit value/lower limit value limit function (NEO-II / NEO-III)
- One set of limit values can be set for each registered calibration curve.
- If the measured value falls outside the upper/lower limit range, the set limit value will blink and an alarm will notify you.
- Large capacity measurement value memory function (NEO-II / NEO-III)
- The data memory function allows one person to perform multi-point measurements, where thousands of film thickness inspections are performed per day.
- You can save labor and reduce costs in inspection work.
- The number of memories is 20,000 points (NEO-II) and 40,000 points (NEO-III).
- You can work without worrying about remaining memory.
- Measured data is divided into groups, blocks, etc. and saved.
- Wireless output to printer (NEO-III)
- Using a dedicated receiver (sold separately), data can be transferred to the printer using a specified low-power radio exclusive to Japan.
Model
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SWT-NEO
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Measurement range
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Depends on connected probe
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Display method
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Graphic LCD (data/message) with backlight function
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Calibration curve calibration
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2-point calibration formula (zero point, standard adjustment point)
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Calibration curve setting/save
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One each for iron and non-ferrous metals
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Measurement data memory
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-
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data transfer
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USB
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Statistics function
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-
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Additional functions
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●Measurement mode switching (hold/continuous) ●Display resolution switching Unit switching (㎛/mil) ●Auto power off (approx. 3 minutes) ●Tilt stand ●Upper/lower limit value setting (NEO-II, NEO-III)
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power supply
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2 AA alkaline batteries, continuous use time (25 hours*) AC adapter *maximum (may vary depending on usage conditions)
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Operating temperature
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0 to 40℃ (no condensation)
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Dimensions/weight
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72 (W) x 32 (H) x 156 (D) mm, approximately 200g (including battery)
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accessories
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- Batteries,
- storage case,
- hand strap cord,
- warranty card/user registration form,
- instruction manual
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option
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Probe, AC adapter, USB transfer cable
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